• 君临国际

    L-915
    Automatic Epi-Up LED Probing and Testing System
    Integrated design of probe test, reliable test, and high accuracy
    Fully automatic loading and unloading system, supporting double cassette test
    Support two positioning methods: flat edge or notch by the wafer
    Compatible with test of 4 and 6-inch wafers
    Accurate chiplet scanning combined with custom test
    Active probe pressure adjustment technology, reliable probe mark control
    Rapid heating and cooling system (optional)
    Test band covers ultraviolet (UVC/UVB/UVA), blue, green, yellow, red, and white light, etc. (optional)
    Current source gear 1.5A@200V
    A variety of ESD specifications and long ESD service life in the industry (optional)
    Support general electrical parameters, and optical parameters including WLP/WLD/WLC/HW/PURITY/CIE-x/CIE-y/CCT/RA/R1-R15
    Support Mini and Micro LED gears
    Application field

     LED chip test

    Main functions
    Sampling test of optical parameters
    Automatic probe cleaning
    Automatic alignment and fast scanning and positioning
    Real-time display and automatic adjustment of probe pressures by the active edge detector
    Automatic probe grinding
    Server-side management of product files
    Automatically output activation report
    Cavity point positioning (0,0)
    Automatic regional anomaly retest
    Peripheral shrinkage point and shrinkage cavity point
    Different test conditions for different channels
    Different test conditions for the inner circle and the outer circle
    Full test for the outer circle and sampling test for the inner circle
    Multi-mapping real-time display
    Automatic regional anomaly retest
    Support connection with MES to automatically load product files
    Re-measurement of an NG point
    Edge detection, height detection, and fixing test
    Expansion test, user-defined test, and edge detection test
    Sampling test, and then full test
    Sampling test of a random point
    Automatic BIN classification of test data
    Test application
    Formal LED WAT Test
    Special application
    Rapid heating and cooling test
    Automated factory
    Support front automatic line upgrade
    Consultation/Complaint
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    Content
    0755-28938875